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Avoiding Common Errors in X-ray Photoelectron Spectroscopy Data Collection and Analysis, and Properly Reporting Instrument Parameters

Joshua W. Pinder,George H. Major,Donald R. Baer,Jeff Terry,James E. Whitten,Jan Cechal, Jacob D. Crossman, Alvaro J. Lizarbe,Samira Jafari,Christopher D. Easton,Jonas Baltrusaitis,Matthijs A. van Spronsen,Matthew R. Linford

APPLIED SURFACE SCIENCE ADVANCES（2024）

Cited 35|Views44
Key words
X-ray photoelectron spectroscopy,XPS,Reporting,Data collection,Common errors
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