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Direct Observation of Single-Atom Defects in Monolayer Two-Dimensional Materials by Using Electron Ptychography at 200 Kv Acceleration Voltage

Ying Chen,Tzu-Chieh Chou, Ching-Hsing Fang, Cheng-Yi Lu,Chien-Nan Hsiao,Wei-Ting Hsu,Chien-Chun Chen

Scientific Reports（2024）

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