X-ray stress analysis

It is crucial to assess the actual stress conditions of mechanical components and structures to prevent unexpected service failures. X-ray diffraction analysis can determine stresses in crystalline materials by measuring the change in lattice spacing. Using the method, residual stresses, which are those preserved during the manufacture of solid material, can be evaluated non-destructively. Noncontact measurement allows for in situ measurements at high temperatures or under extreme atmospheric conditions. This chapter introduces the basics of X-ray stress analysis, focusing on the X-ray diffraction-sin2ψ technique. Following a brief introduction, fundamental concepts of X-ray diffraction and stress analysis are explained. The use of neutrons is also briefly introduced. Finally, the Summary section includes a list of books that provide detailed descriptions of X-ray diffraction and stress analysis.