Atomic layer deposition assisted fabrication of insertable silver dendrites-based SERS substrates with high adhesion

Considerable efforts have been dedicated to the development of low-cost and highly sensitive surface-enhanced Raman spectroscopy (SERS) substrates, which have found applications in numerous fields. However, the critical factors of adhesion and stability have been insufficiently addressed. Such as Ag dendrites (Ag D) have been recognized for their cost-effectiveness and superior efficiency as SERS substrates, nonetheless, the issue of weak adhesion to the substrate has remained a challenge. Herein, a novel strategy to fabricate a Planar Ag dendritesbased SERS substrate with high adhesion is reported, that employs a combination of atomic layer deposition, roll milling, and chemical etching. The resulting Planar Ag dendrites show excellent adhesion, with a surface stripping force 18 times greater than that of pristine Ag dendrites, allowing for prolonged ultrasonic cleaning. Moreover, the substrate can be used as an insertable SERS sensor to obtain spectral information inside apples due to its excellent adhesion. The proposed design achieves high SERS sensitivity, with a limit of detection of 10-9 M and an analytical enhancement factor of 1.5 x 108 for R6G. Overall, this work provides a valuable reference for improving the adhesion of noble metal nanostructures on supporting substrates, offering a reliable SERS substrate for practical applications.