Nanoscale Three-Dimensional Charge Density and Electric Field Mapping by Electron Holographic Tomography

Microscopy and Microanalysis(2023)

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Journal Article Nanoscale Three-Dimensional Charge Density and Electric Field Mapping by Electron Holographic Tomography Get access Fengshan Zheng, Fengshan Zheng Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, GermanySpin-X Institute, Electron Microscopy Center, School of Physics and Optoelectronics, State Key Laboratory of Luminescent Materials and Devices, Guangdong-Hong Kong-Macao Joint Laboratory of Optoelectronic and Magnetic Functional Materials, South China University of Technology, Guangzhou, China Search for other works by this author on: Oxford Academic Google Scholar Vadim Migunov, Vadim Migunov Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, GermanyCentral Facility for Electron Microscopy, RWTH Aachen University, Aachen, Germany Search for other works by this author on: Oxford Academic Google Scholar Jan Caron, Jan Caron Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany Search for other works by this author on: Oxford Academic Google Scholar Hongchu Du, Hongchu Du Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, GermanyCentral Facility for Electron Microscopy, RWTH Aachen University, Aachen, Germany Search for other works by this author on: Oxford Academic Google Scholar Giulio Pozzi, Giulio Pozzi Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, GermanyDepartment FIM, University of Modena and Reggio Emilia, Modena, Italy Search for other works by this author on: Oxford Academic Google Scholar Rafal E Dunin-Borkowski Rafal E Dunin-Borkowski Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany Corresponding author: r.dunin-borkowski@fz-juelich.de Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 1392–1393, https://doi.org/10.1093/micmic/ozad067.716 Published: 22 July 2023
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electric field mapping,electron,tomography,electric field,three-dimensional
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