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A Tabletop X-Ray Tomography Instrument for Nanometer-Scale Imaging: Integration of a Scanning Electron Microscope with a Transition-Edge Sensor Spectrometer

Nathan Nakamura,Paul Szypryt,Amber L. Dagel,Bradley K. Alpert,Douglas A. Bennett,W. B. Doriese,Malcolm Durkin,Joseph W. Fowler,Dylan T. Fox,Johnathon D. Gard,Ryan N. Goodner, J. Zachariah Harris,G. C. Hilton,Edward S. Jimenez,Burke L. Kernen,Kurt W. Larson,Zachary H. Levine,Daniel McArthur,Kelsey M. Morgan,Galen C. O’Neil,Nathan J. Ortiz,Christine G. Pappas,C. D. Reintsema,Daniel R. Schmidt, P. A. Schulz,Kyle R. Thompson,Joel N. Ullom,Leila R. Vale,Courtenay T. Vaughan,Christopher J. Walker,Joel C. Weber,Jason Wheeler,Daniel S. Swetz

openalex（2022）

Cited 1|Views25
Key words
Scanning Electron Microscopy,Environmental Scanning Electron Microscopy,X-ray Photoelectron Spectroscopy,Transition-Edge Sensors
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