Hybridization of ellipsometry and XPS energy loss: robust band gap and broadband optical constants determination of thin films

Théo Levert, Jon De Vecchy, Jean-Luc Duval, Stéphan Verdier,Delphine Le Cunff, B. Pelissier

HAL (Le Centre pour la Communication Scientifique Directe)（2022）

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ellipsometry,optical constants determination,xps energy loss,thin films,robust band gap

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