Raman spectroscopy and ellipsometry hybridization: application to GeSbTe crystallization measurement for in line control

Jon De Vecchy, J.H. Tortai, J. Moeyaert, Y. Le Friec,Delphine Le Cunff, B. Pelissier

HAL (Le Centre pour la Communication Scientifique Directe)(2022)

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Key words
crystallization measurement,ellipsometry hybridization,spectroscopy
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