Electrical characterization of PA-MBE grown GaN nanowires via conductive probe AFM - Effect of load and generator resistances

Tanbir Sodhi,Pascal Chrétien, Laurent Travers,Frédéric Houzé, N. Gogneau

HAL (Le Centre pour la Communication Scientifique Directe)(2021)

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gan nanowires,conductive probe afm,electrical characterization,pa-mbe
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