检索
AI 对话
AI 辅写
analysis
趋势分析
编组
数据平台
more
更多
排名必读论文期刊顶会热点AI 简史溯源树小脉星探人才迁徙塔尖人才国防情报追踪开源工具智慧手语
VIPCreated with Sketch.

Development of an AFM-based technique for extended write/erase endurance measurements of memristive cells

Van T. N. Mai, Văn Hùng Nguyễn, Pascale Auban Senzier, Claude Pasquier,Kang Wang, Marcelo Rozenberg, J. Giapintzakis,Evripides Kyriakides, Thomas Maroutian, Guillaume Agnus, Philippe Lecoeur, Ngoc Duy Nguyen,Sami Oukassi,Raphaël Salot,David Alamarguy,Pascal Chrétien, Jean Lacroix,Olivier Schneegans

HAL (Le Centre pour la Communication Scientifique Directe)（2021）

引用 0|浏览2
暂无评分
关键词
write/erase endurance measurements,extended write/erase,afm-based
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要