Using engineered defects to understand the seed for instabilities in current-driven metal.

Edmund Yu,T. J. Awe, Trevor M Hutchinson, Maren Whiting Hatch,Kevin Yates, Kyle Cochrane, Bruno Bauer, Kurt Tomlinson,William O. Tatum,Kyle Peterson, David Yager-Elorriaga, B. T. Hutsel, Eric Harding,Aidan William Klemmer,M. Gilmore, Gabriel Shipley, Seth Kreher

OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)（2020）

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defects,metal,seed,current-driven

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