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3D Diffractive Imaging of Nanoparticle Ensembles Using an X-ray Laser

Kartik Ayyer,P. Lourdu Xavier,Johan Bielecki,Zhou Shen,Benedikt J. Daurer,Amit Samanta,Salah Awel,Richard Bean,Anton Barty,Tomas Ekeberg,Armando D. Estillore,Klaus Giewekemeyer,Mark S. Hunter,Richard A. Kirian,Henry Kirkwood,Yoonhee Kim,Jayanath Koliyadu,Holger Lange,Romain Letruin,Jannik Lübke,Andrew J. Morgan,Nils Roth,Tokushi Sato,Marcin Sikorski,Florian Schulz,John C. H. Spence,Patrik Vagovič,Tamme Wollweber,Lena Worbs,Oleksandr Yefanov,Yulong Zhuang,Filipe R. N. C. Maia,Daniel A. Horke,Jochen Küpper,N. Duane Loh,Adrian P. Mancuso⋈,Henry N. Chapman

OSTI OAI (US Department of Energy Office of Scientific and Technical Information)（2024）

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关键词
Diffraction Microscopy,Nanoscale Imaging,Structure Determination,Single-Particle Analysis,Coherent Diffractive Imaging
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