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先進FinFETのための電力性能信頼性ブースタとしての冷CMOS【JST・京大機械翻訳】

H L Chiang,T C Chen, J F Wang, S Mukhopadhyay, W K Lee,C L Chen,W S Khwa, B Pulicherla,P J Liao,K W Su,K F Yu, T Wang,C H Diaz, J Cai

IEEE Conference Proceedings（2020）

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