Optical Characteristics of Silver Thin Films from Island to Percolation in the Ultra-Wide Infrared Spectral Range

Silver (Ag) thin films have garnered significant attention due to their unique optical properties. This paper systematically investigates the optical characteristics of Ag films prepared using the electron beam evaporation method. The investigation was conducted using spectroscopic ellipsometry and covers a broad wavelength range of 1679 nm to 36 mu m (0.738-0.034 eV), spanning from near-infrared to far-infrared regions. Optical and dispersion models were developed to analyze the impacts of Ag nanostructures on the complex refractive indices, dielectric functions, and reflectance. The results indicate that Ag particles and coalescence films exhibit non-metallic and low absorption properties, while Ag percolation and continuous films present a typical Drude model. The reflectance of Ag films increases as the film coverage ratio increases, and it can reach close to 100% in continuous film. Additionally, a non-destructive, non-contact, and vacuum-free means of confirming the percolation threshold of Ag films was proposed based on the slope of the imaginary part curve. This work is useful to guide simulations and provide a basis for the applications of Ag films in different fields.