Ultra-high Energy Resolution EELS and 4D STEM at Cryogenic Temperatures

Journal Article Ultra-high Energy Resolution EELS and 4D STEM at Cryogenic Temperatures Get access B Plotkin-Swing, B Plotkin-Swing Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar A Mittelberger, A Mittelberger Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar B Haas, B Haas Department of Physics & IRIS Adlershof, Humboldt-Universität zu Berlin, Berlin, Germany Search for other works by this author on: Oxford Academic Google Scholar J C Idrobo, J C Idrobo Department of Material Science and Engineering, University of Washington, Seattle, WA, USAPhysical Sciences Division, Pacific Northwest National Laboratory, Richland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar B Graner, B Graner Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar N Dellby, N Dellby Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar M T Hotz, M T Hotz Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar C E Meyer, C E Meyer Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar S C Quillin, S C Quillin Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar O L Krivanek, O L Krivanek Nion R&D, Kirkland, WA, USADepartment of Physics, Arizona State University, Tempe AZ, USA Search for other works by this author on: Oxford Academic Google Scholar ... Show more T C Lovejoy T C Lovejoy Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 1698–1699, https://doi.org/10.1093/micmic/ozad067.875 Published: 22 July 2023