Characterizing Magnetic Skyrmion Ordering and Dis-Ordering in the Presence of Crystalline Dislocations using Lorentz Transmission Electron Microscopy

Reed Yalisove,Peter Meisenheimer, Hongrui Zhang,Rui Chen, Xiang Chen,Robert J Birgeneau,Jie Yao, Ramamoorthy Ramesh,Mary C Scott

Microscopy and Microanalysis(2023)

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Abstract
Journal Article Characterizing Magnetic Skyrmion Ordering and Dis-Ordering in the Presence of Crystalline Dislocations using Lorentz Transmission Electron Microscopy Get access Reed Yalisove, Reed Yalisove University of California, Berkeley, Department of Materials Science and Engineering, Berkeley, CA, United StatesLawrence Berkeley National Lab, National Center for Electron Microscopy, Berkeley, CA, United States Corresponding author: yalisove@berkeley.edu Search for other works by this author on: Oxford Academic Google Scholar Peter Meisenheimer, Peter Meisenheimer University of California, Berkeley, Department of Materials Science and Engineering, Berkeley, CA, United States Search for other works by this author on: Oxford Academic Google Scholar Hongrui Zhang, Hongrui Zhang University of California, Berkeley, Department of Materials Science and Engineering, Berkeley, CA, United States Search for other works by this author on: Oxford Academic Google Scholar Rui Chen, Rui Chen University of California, Berkeley, Department of Materials Science and Engineering, Berkeley, CA, United StatesLawrence Berkeley National Lab, Materials Sciences Division, Berkeley, CA, United States Search for other works by this author on: Oxford Academic Google Scholar Xiang Chen, Xiang Chen Lawrence Berkeley National Lab, Materials Sciences Division, Berkeley, CA, United StatesUniversity of California, Department of Physics, Berkeley, CA, United States Search for other works by this author on: Oxford Academic Google Scholar Robert J Birgeneau, Robert J Birgeneau Lawrence Berkeley National Lab, Materials Sciences Division, Berkeley, CA, United StatesUniversity of California, Department of Physics, Berkeley, CA, United States Search for other works by this author on: Oxford Academic Google Scholar Jie Yao, Jie Yao University of California, Berkeley, Department of Materials Science and Engineering, Berkeley, CA, United StatesLawrence Berkeley National Lab, Materials Sciences Division, Berkeley, CA, United States Search for other works by this author on: Oxford Academic Google Scholar Ramamoorthy Ramesh, Ramamoorthy Ramesh University of California, Berkeley, Department of Materials Science and Engineering, Berkeley, CA, United States Search for other works by this author on: Oxford Academic Google Scholar Mary C Scott Mary C Scott University of California, Berkeley, Department of Materials Science and Engineering, Berkeley, CA, United StatesLawrence Berkeley National Lab, National Center for Electron Microscopy, Berkeley, CA, United States Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 1648–1649, https://doi.org/10.1093/micmic/ozad067.848 Published: 22 July 2023
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