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Structuring Dielectric Interfaces for Enhanced Electrical Strength

André Knapp, Fabian Kopsch,Anett Müller, A. J. Amalanathan,Stefan Kornhuber,Andreas Fery

2023 International Symposium on Electrical Insulating Materials (ISEIM)(2023)

Cited 0|Views9
Key words
wrinkles,interface,silicone,voids,breakdown,partial discharge
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