Single Event Upset Response of 12L FinFET Digital Circuits.

Jereme Neuendank, D. Wilson, H. Barnaby, L. Clark, J. Brunhaver, Jack Manuel,Joshua Young,Gyorgy Vizkelethy,Edward Bielejec

Proposed for presentation at the Single Event Effects Symposium held May 16-20, 2022 in LaJoll, CA United States（2022）

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