All-Silicon Topology Optimized Two-Photon Absorption Detector for On-Chip Interconnects

Ayman N. Kamel, Marcus R. A. Newman,Andrey Marchevsky,Rasmus E. Christiansen, Ali N. Babar, Philip T. Kristensen,Ole Sigmund,Søren Stobbe,Jesper Mørk,Kresten Yvind

2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)（2023）

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摘要

Optical interconnects using low-capacitance optoelectronic devices are providing a way forward for the energy-sustainable growth in information technology [1]. For single-die electronic circuits, the co-integration of photonic interconnects faces challenges combining multiple materials, and the typical large size of lasers and detectors.

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关键词

all-silicon topology optimized resonant PIN photodiode,all-silicon topology optimized two-photon absorption detector,ion-implanted n-and region,ion-implanted p-doped region,objective function,on-chip interconnects,optimization,PIN diode,quality factor,ridge waveguide,SEM image,Si/int,SOI wafer

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