Unified 0.75pJ/Bit TRNG and Attack Resilient 2F²/Bit PUF for Robust Hardware Security Solutions with 4-layer Stacking 3D NbOx Threshold Switching Array

Qingting Ding,Haijun Jiang,Jing Li,Chao Liu,Jie Yu,Pei Chen,Yulin Zhao,Yaxin Ding,Tiancheng Gong,Jianguo Yang,Qing Luo,Qi Liu,Hangbing Lv,Ming Liu

2021 IEEE International Electron Devices Meeting (IEDM)（2021）

引用 5|浏览6

关键词

4-layer stacking 3D threshold switching array,attack resilient 2F2/bit PUF,dynamic TS variations,high PUF key density,ideal unbiased normal distribution,inter-die Hamming distances,intra-die Hamming distances,low native bit error rate,low-cost secure integrated systems,machine learning attack,NbOx/int,NIST SP800-22 tests,NIST SP800-90B,physically unclonable functions,power noise attack,PUF entropy,PUF function,robust hardware security solutions,static leakage current mismatch,stochastic oscillator periods,thermal noise,true random number generators,TS process,ultra-low energy consumption,unified TRNG,unified approach,voltage 2.0 V

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要

Unified 0.75pJ/Bit TRNG and Attack Resilient 2F2/Bit PUF for Robust Hardware Security Solutions with 4-layer Stacking 3D NbOx Threshold Switching Array

Unified 0.75pJ/Bit TRNG and Attack Resilient 2F²/Bit PUF for Robust Hardware Security Solutions with 4-layer Stacking 3D NbOx Threshold Switching Array