Noise Analysis in FinFET-based Analog Circuit with Technology Scaling
2023 IEEE Devices for Integrated Circuit (DevIC)(2023)
Abstract
Noise in any circuit determines the minimum acceptable signal level that can process without compromising its functionality. In field-effect transistors (FETs), mainly two types of noise occur, i.e., flicker (1/1) and thermal noise, which requires proper attention for designing the analog circuits. This paper analyzes the noise behavior in FinFET-based cascode differential amplifier (CDA) for different technological nodes. Using well-calibrated PTM models in HSPICE, we investigated: (i) the Noise behavior in 22nm node FinFET and planarMOSFET; (ii) the impact of FinFET technology nodes (i.e., 16nm, 14nm, 10nm) over noise spectral density; (iii) trend of the corner frequency ($f_{\mathrm{c}}$) demarcating the flicker and thermal noise in scaled FinFET; (iv) impact of varying the number of fins on the noise behavior. The understanding of Noise in FinFET is thus worth exploring to design reliable FinFET-based analog circuits.
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Key words
noise spectral density,FinFET,flicker noise,thermal noise,corner frequency
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