Impact of SOT & STT stress on MTJ degradation in SOT-MRAM

Simon Van Beek,Vaishnavi Kateel,Kaiming Cai,Nico Jossart,Siddharth Rao,Sebastien Couet

2023 IEEE International Magnetic Conference - Short Papers (INTERMAG Short Papers)（2023）

引用 0|浏览10

暂无评分

摘要

SOT-MRAM devices are promising due to a decoupled read and write path. As such, SOT-MRAM is considered robust against MgO breakdown of the MTJ. However, during switching, high current densities flow through the thin metallic SOT layer causing significant self-heating of the MTJ. We investigate the degradation of the MTJ during hybrid SOT & STT stress. The resilience to breakdown is impacted by the SOT stress because of the elevated MTJ temperature, supported by thermal simulations.

查看译文

关键词

SOT-MRAM,failure,self-heating,MTJ,MgO

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要