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Long Live O-PCMs: Understanding Reliability Challenges of Optical Phase Change Materials

Cosmin-Constantin Popescu,Brian Mills,Louis Martin Monier,Luigi Ranno,Yifei Zhang,Qingyang Du,Carlos Ríos,Steven Vitale,Christopher Roberts,Paul Miller,Vladimir Liberman,Hyun Jung Kim,Kiumars Aryana,Myungkoo Kang,Kathleen Richardson,Dennis Callahan,Sarah Geiger,Tian Gu,Juejun Hu

2023 Conference on Lasers and Electro-Optics (CLEO)（2023）

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Abstract
The endurance of optical phase change material-based devices for integrated and free-space applications is explored and improvements are proposed based on limiting PCM dewetting, protective layer delamination, and elemental migration towards stable phases.
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