650V 4H-SiC VDMOSFET with Additional n Region: A Simulation Study
2021 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia)(2021)
Abstract
A novel 4H-SiC VDMOSFET with additional n region(NA-VDMOSFET) is proposed and investigated by TCAD simulation in this paper. The NA-VDMOSFET exhibits
$0.96\mathrm{m}\Omega\cdot \text{cm}^{2}$
lower specific resistance (Ron, sp) and 0.2V higher threshold voltage (V
th
) than the conventional VDMOSFET(C-VDMOSFET) with forward blocking voltage (V
DSS
) and the maximum electric field in gate oxide (E
OX, Max
) satisfy the design value. Meanwhile, the total losss (E
total
) reduced lightly compared with C-VDMOSFET. The overall similar performance makes NA-VDMOSFET an excellent choice for manufacture of uniform channel length. It shows the doping profile and dimension of NA and thichness of SiO
2
for NA implantation.
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Key words
4H-SiC,VDMOSFET,additional n region,JFET resistance,uniform channel length
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