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Experiment and Analysis of Damage of CMOS Image Sensor Induced by Proton Irradiation with Different Bias Conditions

Nie Xu,Wang Zujun,Wang Baichuan,Xue Yuanyuan,Huang Gang,Lai Shankun,Tang Ning,Wang Maocheng,Zhao Mingtong, Yang Fuyu,Wang Zhongming

ACTA OPTICA SINICA（2023）

Cited 0|Views15
Key words
remote sensing and sensors,CMOS image sensor,proton irradiation,transient response,dark signal,random telegraph signal
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