Statistical Comparison of Substructures in Pure Aluminum Before and after Creep Deformation, Based on EBSD Image Data.
MICROSCOPY AND MICROANALYSIS（2023）
关键词
crystallographic descriptor,dislocation-climb-controlled creep,electron backscatter diffraction (EBSD),geometric descriptor,kernel average misorientation (KAM),pure aluminum,quantification,segmentation,statistical image analysis,subgrain
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