Profilometric measurement of low wear: A review

Accurate wear measurement is an important task. In this paper, measurements of wear levels within the limits of the original surface topography using profilometric methods were presented and discussed. The relocation methods, allowing measurements of surface fragments in the same place prior and after tests, were presented. Profilometric methodologies without sample relocation were discussed. Methods of quantitative wear assessment were shown. Qualitative wear characterisations were studied. Future trends in low-wear profilometric mea-surement were discussed.