A unified test data volume compression scheme for circular scan architecture using hosted cuckoo optimization

Test data volume (TDV) is the main issue for lessening the test data volume for system-on-a-chip (SoC), lessening test time, average power, and peak power. Several optimization algorithms have been presented previously to decrease the TDV, but none of the algorithm provides sufficient results. To overcome these issues, a novel test data compression technique for CSA using hosted cuckoo optimization algorithm is proposed in this manuscript for lessening the test data volume during fault analysis. The conflicting bits volume is decreased to achieve the ratio of better compression with reduced test application time (TAT) including test data volume. The proposed algorithm achieves fast global searching capability. Hosted cuckoo optimization (HCOA) algorithm is used to find the optimal solution for the constrained problems. The proposed method is executed in MATLAB. The proposed method attains 23.84%, 27.94%, 32.84% higher compression ratio compared with the existing methods.