Surface characterization and electroanalytical applications of the newly developed copper(II)-selective potentiometric sensor

In this work, we developed a new copper(II)-selective potentiometric sensor and investigated its surface with scanning electron microscopy (SEM). Besides the surface images of the sensors conditioned in copper(II) solutions, energy–dispersive X-ray (EDX) and mapping studies were carried out. According to the results obtained, it was determined that copper(II) ions adhered to the porous areas on the sensor surface, and that Cu 2+ ions showed a wide distribution on the sensor surface in mapping studies. The new sensor had a Nernstian response of 29.3 ± 0.5 mV/decade in the concentration range of 1.0 × 10 −1 –1.0 × 10 −5 M and a low detection limit of 8.56 × 10 −6 M. The proposed sensor had fast response time (< 10 s), wide pH working range (5.0–10.0), good repeatability and stability. Finally, the sensor performed the determination of copper(II) ions in various water samples with very high recoveries (96.0–102.0%). Graphical abstract