Prediction and Analysis of Radiated EMI from a Wafer-Level Package Based on IC Source Modeling
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY（2024）
关键词
Electromagnetic interference,Integrated circuit modeling,Semiconductor device modeling,Current measurement,Voltage-controlled oscillators,Predictive models,Capacitors,Electromagnetic interference (EMI),integrated circuit (IC),radiated emission,redistribution layer (RDL),wafer-level package (WLP)
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要