Reconfigurable Self-Destructing Pre-Amplifier Physical Unclonable Function
2023 IEEE 32ND MICROELECTRONICS DESIGN & TEST SYMPOSIUM, MDTS(2023)
摘要
Security in integrated circuits is of critical importance when the data may contain mission critical program information. In modern integrated circuits, the critical program information on the chip is protected by requiring authentication with a Physical Unclonable Function (PUF) challenge-response pair. Concern over the ability to reverse engineer a PUF key and produce a clone has introduced new challenges to securing chips. This work discusses a silicon based Pre-Amplifier PUF that can self-destruct on command and supports reconfigurability through bitcell regrouping. Both techniques may be deployed as a tamper response to protect the underlying data.
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关键词
Self-destruct, Electromigration, Time-Dependent Dielectric Breakdown, Reconfigurable Physical Unclonable Function
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