Relaxor characteristics of PSLZT-BMT-based ferroelectric material ceramics
JOURNAL OF CERAMIC PROCESSING RESEARCH(2023)
Abstract
(1-x)[(Pb0.94Sr0.05La0.01)(Zr0.54Ti0.46)(0.9975)O-3]-x[Bi(Mn1/2Ti1/2)O-3] (PSLZT-BMT) ferroelectric material ceramics with x in the range of 0-0.05 mol were successfully synthesized following the conventional solid-phase route. The materials were thoroughly investigated to study their structural phase, microstructure, ferro-piezoelectric characteristics, and dielectric behavior. The experimental results show that the density of the samples decreased from 7.75 to 7.58 g/cm(3), and the relative density decreased in the range of 98.48%-96.28%. However, with increasing contents of BMT, the dielectric and ferroelectric properties of PSLZT-BMT ceramics tend to decrease, specifically the maximum dielectric constant (epsilon(max)) of PSLZT-BMT decreased in the range of 23579-9991 and the residual polarization (P-r) decreases in the range of 22.54-7.87 mu C/cm(2) when the doping content increased in the range of 0.0-0.05 mol. The diffusivity values (gamma) of the PSLZT-BMT material are 1.74, 1.78, 1.82, 1.84, 1.79, and 1.77 when the doping content x varies as 0.0, 0.01, 0.02, 0.03, 0.04, and 0.05 mol, respectively, which is characteristic of relaxor ferroelectric materials. Besides, the T-m, T-B, TC-W, and C values depend on BMT concentration, and the trend decreases.
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Key words
PSLZT-BMT, Ferroelectric materials, Dielectric materials, Relaxor materials, Ceramics
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