Design and Application of a Linear Acceleration Test Setup for Defect Diagnostics in High-Throughput Transportation Systems

Stephan Grosser,Matthias Schak,Christian Hagendorf

ETLTC-ICETM2023 INTERNATIONAL CONFERENCE PROCEEDINGS ICT Integration in Technical Education &amp Entertainment Technologies and Management AIP Conference Proceedings（2023）

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Delay Fault Testing,Test Access Architecture,Analog Circuit Fault Diagnosis,Low-Power Testing,Scan Testing

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