Experiment Study of Single Event Functional Interrupt in Analog-to-Digital Converters Using a Pulsed Laser

Single Event Functional Interrupt (SEFI) poses a severe threat to the normal operation of spacecraft. This paper investigates SEFI in Analog-to-Digital Converters (ADCs) with storage units using precision positioning of pulsed lasers. Based on the experiment, it was discovered that a bit flip in the configuration registers in ADCs results in changes in parameters such as digital filter frequency, operating mode, and gain, leading to an upward or downward offset of ADC output codes. Similarly, a bit flip in the calibration registers also causes ADC output codes to shift upwards or downwards, or even output a value of zero. Furthermore, it was observed that SEFI phenomena can occur due to current latch-up in ADC input pins, causing the inability to read or write data in ADC storage units. This current latch-up can be resolved through power cycling or configuring the pins into a high-impedance state. This work highlights the significance of SEFI phenomena in ADCs, emphasizing the serious threat posed by storage unit flipping-induced SEFI to the proper functioning of ADCs. Moreover, the SEFI phenomenon caused by current latch-up in input pins is difficult to detect in practice, making it highly elusive. Once it occurs, it severely impacts the functionality of ADCs.