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Time Resolved Insights into Abnormal Grain Growth by in Situ Synchrotron Measurements

M. Vollmer,S. Degener,A. Bolender,A. Bauer,A. Liehr,A. Stark,N. Schell,P. Barriobero-Vila,G. Requena,T. Niendorf

ACTA MATERIALIA（2023）

Cited 4|Views9
Key words
Single crystals,Grain growth method,Synchrotron diffraction,High-energy X-ray diffraction,Grain boundary migration
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