高帯域幅メモリ(HBM)のための非接触2Gb/s I/O試験法の設計【Powered by NICT】
Hyunui Lee, Kang Sukyong,Yu Hye-Seung,Won-Joo Yun,Jung Jae-Hun,Ahn Sungoh, Kim Wang-Soo,Kil Beomyong,Sung Yoo-Chang,Shin Sang-Hoon,Park Yong-Sik,Kim Yong-Hwan,Nam Kyung-Woo,Song Indal,Kyomin Sohn,Bae Yong-Cheol,Choi Jung-Hwan,Sung-Min Jang,Jin Gyo-Young IEEE Conference Proceedings（2016）
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