C1.1 - One-Step Traceability with NIST on a Chip: A Case for the Emergence of Quantum-Based Methods for Metrology and Sensing of Pressure, Vacuum, Temperature, Electric Fields, Mass, Force, and Torque, all enabled by the New SI James Hendricks, Brian D. Goldstein,Alexandra B. Artusio‐Glimpse, Christopher L. Holloway,Matthew T. Simons,Nikunjkumar Prajapati,Andrew P. Rotunno,Samuel Berweger,Nikolai N. Klimov,Zeeshan Ahmed,Daniel S. Barker,Stephen Eckel,James A. Fedchak, J. Ricker,Kevin O. Douglass,Tobias Herman, Michal Chojnacky,Julia Scherschligt,Stephan Schlamminger,Leon Chao, Z. Comden, J. Draganov, Tuyen Bui, Katrina Campbell,Maitreyi JayaseelanLectures（2023）引用 0|浏览4暂无评分关键词chip,nist,metrology,one-step,quantum-basedAI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
