Deep Learning for Automated Quantification of Irradiation Defects in TEM Data: Relating Pixel-level Errors to Defect Properties.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada(2023)

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Journal Article Deep Learning for Automated Quantification of Irradiation Defects in TEM Data: Relating Pixel-level Errors to Defect Properties Get access Rajat Sainju, Rajat Sainju Department of Materials Science and Engineering, University of Connecticut, Storrs, CT, USA Search for other works by this author on: Oxford Academic Google Scholar Graham Roberts, Graham Roberts Department of Computer Science and Engineering, University of Connecticut, Storrs, CT, USA Search for other works by this author on: Oxford Academic Google Scholar Wei-Ying Chen, Wei-Ying Chen Nuclear Science and Engineering Division, Argonne National Laboratory, Lemont, IL, USA Search for other works by this author on: Oxford Academic Google Scholar Brian Hutchinson, Brian Hutchinson Computer Science Department, Western Washington University, Bellingham, WA, USANational Security Directorate, AI and Data Analytics Division, Pacific Northwest National Laboratory, Richland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar Qian Yang, Qian Yang Department of Computer Science and Engineering, University of Connecticut, Storrs, CT, USA Search for other works by this author on: Oxford Academic Google Scholar Caiwen Ding, Caiwen Ding Department of Computer Science and Engineering, University of Connecticut, Storrs, CT, USA Search for other works by this author on: Oxford Academic Google Scholar Danny J Edwards, Danny J Edwards Energy and Environment Directorate, Nuclear Sciences Division, Pacific Northwest National Laboratory, Richland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar Meimei Li, Meimei Li Nuclear Science and Engineering Division, Argonne National Laboratory, Lemont, IL, USA Search for other works by this author on: Oxford Academic Google Scholar Yuanyuan Zhu Yuanyuan Zhu Department of Materials Science and Engineering, University of Connecticut, Storrs, CT, USAEnergy and Environment Directorate, Nuclear Sciences Division, Pacific Northwest National Laboratory, Richland, WA, USA Corresponding Author: yuanyuan.2.zhu@uconn.edu Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 1559–1560, https://doi.org/10.1093/micmic/ozad067.802 Published: 22 July 2023
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irradiation defects,deep learning,tem data,pixel-level
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