High-Fidelity 3D Imaging Achieved Through Multislice Electron Tomography Using 4D-STEM.

Journal Article High-Fidelity 3D Imaging Achieved Through Multislice Electron Tomography Using 4D-STEM Get access Juhyeok Lee, Juhyeok Lee Department of Physics, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Korea Search for other works by this author on: Oxford Academic Google Scholar Moosung Lee, Moosung Lee Department of Physics, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, KoreaKAIST Institute for Health Science and Technology, Daejeon, Korea Search for other works by this author on: Oxford Academic Google Scholar YongKeun Park, YongKeun Park Department of Physics, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, KoreaKAIST Institute for Health Science and Technology, Daejeon, KoreaTomocube, Inc., Daejeon, Korea Search for other works by this author on: Oxford Academic Google Scholar Colin Ophus, Colin Ophus National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California, United States Search for other works by this author on: Oxford Academic Google Scholar Yongsoo Yang Yongsoo Yang Department of Physics, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Korea Corresponding author: yongsoo.yang@kaist.ac.kr Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 1388–1389, https://doi.org/10.1093/micmic/ozad067.714 Published: 22 July 2023