Use of Spectrum Simulation to Acquire Reliable Scans with a Wavelength Dispersive Spectrometer.

Journal Article Use of Spectrum Simulation to Acquire Reliable Scans with a Wavelength Dispersive Spectrometer Get access Philippe Pinard, Philippe Pinard Oxford Instruments NanoAnalysis, High Wycombe, United Kingdom Corresponding author: philippe.pinard@oxinst.com Search for other works by this author on: Oxford Academic Google Scholar Rosie Jones, Rosie Jones Oxford Instruments NanoAnalysis, High Wycombe, United Kingdom Search for other works by this author on: Oxford Academic Google Scholar Lucia Spasevski, Lucia Spasevski Oxford Instruments NanoAnalysis, High Wycombe, United Kingdom Search for other works by this author on: Oxford Academic Google Scholar Simon Burgess, Simon Burgess Oxford Instruments NanoAnalysis, High Wycombe, United Kingdom Search for other works by this author on: Oxford Academic Google Scholar Peter Statham Peter Statham Oxford Instruments NanoAnalysis, High Wycombe, United Kingdom Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 81–82, https://doi.org/10.1093/micmic/ozad067.032 Published: 22 July 2023