Ultra-high Resolution EELS Analysis and STEM Imaging at 20 keV.

Journal Article Ultra-high Resolution EELS Analysis and STEM Imaging at 20 keV Get access N Dellby, N Dellby Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar S C Quillin, S C Quillin Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar O L Krivanek, O L Krivanek Nion R&D, Kirkland, WA, USADepartment of Physics, Arizona State University, Tempe AZ, USA Search for other works by this author on: Oxford Academic Google Scholar P Hrncirik, P Hrncirik Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar A Mittelberger, A Mittelberger Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar B Plotkin-Swing, B Plotkin-Swing Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar T C Lovejoy T C Lovejoy Nion R&D, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 626–627, https://doi.org/10.1093/micmic/ozad067.305 Published: 22 July 2023