High-Resolution Structure Determination At 100kv Enabled by New Falcon-C Direct Electron Detector

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada(2023)

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Journal Article High-Resolution Structure Determination at 100kV Enabled by New Falcon-C Direct Electron Detector Get access Adrian Koh, Adrian Koh Materials and Structural Analysis Division, Thermo Fisher Scientific, Eindhoven, Netherlands Search for other works by this author on: Oxford Academic Google Scholar Wen Yang, Wen Yang Materials and Structural Analysis Division, Thermo Fisher Scientific, Eindhoven, Netherlands Search for other works by this author on: Oxford Academic Google Scholar Dimple Karia, Dimple Karia Materials and Structural Analysis Division, Thermo Fisher Scientific, Eindhoven, Netherlands Search for other works by this author on: Oxford Academic Google Scholar Lingbo Yu, Lingbo Yu Materials and Structural Analysis Division, Thermo Fisher Scientific, Eindhoven, Netherlands Search for other works by this author on: Oxford Academic Google Scholar Jeff Lengyel, Jeff Lengyel Materials and Structural Analysis Division, Thermo Fisher Scientific, Eindhoven, Netherlands Search for other works by this author on: Oxford Academic Google Scholar Abhay Kotecha Abhay Kotecha Materials and Structural Analysis Division, Thermo Fisher Scientific, Eindhoven, Netherlands Corresponding Author: abhay.kotecha@thermofisher.com Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Page 1053, https://doi.org/10.1093/micmic/ozad067.539 Published: 22 July 2023
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electron,high-resolution high-resolution
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