The TOMO Project - Integrating a Fully Functional Atom Probe in an Aberration-Corrected TEM.
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada(2023)
摘要
Journal Article The TOMO Project – Integrating a Fully Functional Atom Probe in an Aberration-Corrected TEM Get access Joachim Mayer, Joachim Mayer Ernst Ruska-Centre, Forschungszentrum Jülich GmbH, Jülich, GermanyCentral Facility for Electron Microscopy, RWTH Aachen University, Aachen, Germany Corresponding author: j.mayer@fz-juelich.de Search for other works by this author on: Oxford Academic Google Scholar Juri Barthel, Juri Barthel Ernst Ruska-Centre, Forschungszentrum Jülich GmbH, Jülich, Germany Search for other works by this author on: Oxford Academic Google Scholar Ashok Vayyala, Ashok Vayyala Ernst Ruska-Centre, Forschungszentrum Jülich GmbH, Jülich, Germany Search for other works by this author on: Oxford Academic Google Scholar Rafal Dunin-Borkowski, Rafal Dunin-Borkowski Ernst Ruska-Centre, Forschungszentrum Jülich GmbH, Jülich, Germany Search for other works by this author on: Oxford Academic Google Scholar Maarten Bischoff, Maarten Bischoff Thermo Fisher Scientific, Eindhoven, The Netherlands Search for other works by this author on: Oxford Academic Google Scholar Hugo van Leeuwen, Hugo van Leeuwen Thermo Fisher Scientific, Eindhoven, The Netherlands Search for other works by this author on: Oxford Academic Google Scholar Stephan Kujawa, Stephan Kujawa Thermo Fisher Scientific, Eindhoven, The Netherlands Search for other works by this author on: Oxford Academic Google Scholar Joe Bunton, Joe Bunton CAMECA Instruments, Inc., Madison, WI, United States Search for other works by this author on: Oxford Academic Google Scholar Dan Lenz, Dan Lenz CAMECA Instruments, Inc., Madison, WI, United States Search for other works by this author on: Oxford Academic Google Scholar Thomas F Kelly Thomas F Kelly Steam Instruments, Inc., Madison, WI, United States Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 593–594, https://doi.org/10.1093/micmic/ozad067.286 Published: 22 July 2023
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关键词
functional atom probe,tomo project,aberration-corrected
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