Quantifying Chemical and Structural Order in Scanning Transmission Electron Microscopy (STEM) Datasets Using Spatial Statistics.

Journal Article Quantifying Chemical and Structural Order in Scanning Transmission Electron Microscopy (STEM) Datasets Using Spatial Statistics Get access Michael Xu, Michael Xu Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, United States Search for other works by this author on: Oxford Academic Google Scholar Shaolou Wei, Shaolou Wei Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, United States Search for other works by this author on: Oxford Academic Google Scholar C Cem Tasan, C Cem Tasan Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, United States Search for other works by this author on: Oxford Academic Google Scholar James M LeBeau James M LeBeau Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, United States Corresponding author: lebeau@mit.edu Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 1986–1987, https://doi.org/10.1093/micmic/ozad067.1029 Published: 22 July 2023