Incorporating Component-Level Testing Into Bayesian Degradation Distributions to Estimate a Voltage Regulators Radiation Failure Probabilities

Device-level failure probabilities derived from historical, similar radiation datasets can be inputted into a system-level radiation reliability model to provide insight into that system's failure probability. A linear voltage regulator reliability model that utilizes historical total ionizing dose (TID) [<100 krad(SiO2)] and displacement damage dose (DDD) measurements (<9 x 10(11) equivalent 1-MeV neutrons/cm(2)) is used as a demonstration system. This methodology aims to reduce engineering uncertainty at early design stages before radiation test data are available or on quick turn-around projects without radiation test budgets.