An Analytical Model to Evaluate Well-Potential Modulation and Bipolar Amplification Effects

IEEE TRANSACTIONS ON NUCLEAR SCIENCE(2023)

引用 1|浏览21
暂无评分
摘要
An analytical model to evaluate well-potential modulation and the resulting bipolar amplification effects was proposed and integrated into the circuit-level simulation approach in this article. The key point was to produce an equivalent resistance network and current source between n-well and p-well so that well-potential modulation at arbitrary points could be estimated. It was shown that the simulation results reflected the contribution of bipolar amplification effects and the influence of well-contact placement. The simulated cross sections were consistent with those of heavy ion experimental data, highlighting the reasonableness of the proposed model.
更多
查看译文
关键词
Integrated circuit modeling,Analytical models,Resistance,Monitoring,Modulation,Ions,Transient analysis,Bipolar amplification effects,circuit level,single event,well contact,well-potential modulation
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要