Trap Passivation of 4H-Sic/sio2 Interfaces by Nitrogen AnnealingSuman Das,Hengfei Gu,Lu Wang,Ayayi Ahyi,Leonard C. Feldman,Eric Garfunkel,Marcelo A. Kuroda,Sarit DharJOURNAL OF APPLIED PHYSICS(2023)引用 3|浏览35关键词GaN Power DevicesAI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要