Lateral Electrochemical Metallization Cells for Reconfigurable Interconnect Systems

T. Frahm, M. Buttberg, G. Gvozdev, R. A. Müller,S. Chen, B. Sun, L. Raffauf,S. Menzel,I. Valov,D. Wouters,R. Waser,J. Knoch

IEEE Journal of the Electron Devices Society(2023)

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摘要
Lateral electrochemical metallization (ECM) cells are fabricated with a combined spacer/damascene process. The process allows the realization of nanoscale geometrical distances between the two electrodes independent of lithography. Such lateral ECM cells are an essential part in a reconfigurable interconnect system that may yield a strongly increased connectivity in artificial neural networks. The lateral cells show memristive properties comparable to vertical cells with switching voltages in the range of −1.5V to 2.5V. The influence of electrode line edge roughness on SET kinetics of such lateral cells is investigated via kinetic Monte Carlo simulations, finding a minor influence on SET time variability.
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关键词
Electrochemical metallization (ECM),lift-off,memristor,neuromorphic hardware,RRAM,ReRAM,line edge roughness,Kinetic Monte Carlo
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