X线头影测量长度相关指标与全颅底长的回归分析
Chinese Journal of Orthodontics(2020)
Abstract
目的:探讨颅面自身大小对X线头影测量分析中长度相关指标的影响,并以全颅底长为内部参照,建立回归方程。方法:回顾性分析33例患者的头颅定位侧位片。选取18个标志点测量25个长度相关指标,采用全颅底长代表颅面大小,分析这些长度测量指标与全颅底长的回归关系。结果:所有测量指标与全颅底长都呈正相关,除U6-PP外,其他指标与全颅底长的回归方程均有统计学意义。结论:X线头影测量长度相关指标与全颅底长关系密切,在对长度测量值进行数据分析时,应考虑颅面自身大小对其的影响。
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Key words
X-ray cephalometric measurement,Total cranial base length,Regression analysis
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