Total retardance measurements based on the complex Fourier coefficients for the rotating polarizer analyzer system

We propose a demodulation algorithm based on the calculus of the complex Fourier coefficients; we used a dual rotating polarizer-analyzer polarimeter to show the feasibility of our proposal. Our demodulation algorithm considers the frequency response obtained by the system, and its possible to calculate the total retardation, fast axis orientation and ellipticity of a sample. Our proposal does not require recovering the full Mueller matrix from getting those parameters. In addition, as the proposal does not use retarders for the measurement, the system presents potential applications for multi-wavelength measurements on phase retardation samples. We show experimental results showing the capabilities of our proposal in characterizing a polarization retardance sample.